Open hours: 9.00-7.30 Mon-Fri
SDP_NCL29_2022 - Insitu Surface technique for material Characterization: XPS (ESCA)
X-ray Photoelectron Spectroscopy (XPS) also known as Electron Spectroscopy for Chemical Analysis (ESCA) is the most widely used surface analysis technique for characterizing solid materials because it can be applied to a broad range of materials and provides valuable quantitative and chemical state information from the surface of the material being studied. The average depth of analysis for an XPS measurement is approximately 8- 10 nm which makes it highly surface specific. This course provides the evolution of XPS from a mere surface technique to a powerful insitu technique for studying materials under close to working conditions. The course will also provide lab visit and practical demonstration of how sample analysis is carried out in a conventional spectrometer.
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M. Sc., M. E., M. Tech., B. E., B. Tech. Ph.D.